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Dynamical Theory of X-Ray Diffraction$
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André Authier

Print publication date: 2003

Print ISBN-13: 9780198528920

Published to Oxford Scholarship Online: January 2010

DOI: 10.1093/acprof:oso/9780198528920.001.0001

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Location of atoms at surfaces and interfaces using X-ray standing waves

Location of atoms at surfaces and interfaces using X-ray standing waves

(p.495) 16 Location of atoms at surfaces and interfaces using X-ray standing waves
Dynamical Theory of X-Ray Diffraction


Oxford University Press

This chapter describes the use of dynamical diffraction for the location of atoms and impurities at surfaces and interfaces using the standing waves formed by the superposition of the incident and reflected waves. After an introduction giving the principle of the method and its historical development, the variations of the intensity of the wavefield in the reflection, or Bragg, geometry are calculated and the fluorescent yield determined. Applications to the determination of surface structures, nature and position of impurities, polarity of heteropolar crystals are described. The case of deformed crystals is also considered. The last section concerns standing waves associated with specular reflection.

Keywords:   surfaces, interfaces, impurities, fluorescent yield, standing waves, specular reflection

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