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Dynamical Theory of X-Ray Diffraction$
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André Authier

Print publication date: 2003

Print ISBN-13: 9780198528920

Published to Oxford Scholarship Online: January 2010

DOI: 10.1093/acprof:oso/9780198528920.001.0001

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X-ray diffraction topography

X-ray diffraction topography

(p.513) 17 X-ray diffraction topography
Dynamical Theory of X-Ray Diffraction


Oxford University Press

This chapter describes the various techniques for obtaining X-ray topographs: single-crystal reflection topography (Berg-Barrett), single crystal transmission topography (Lang, section and projection topographs, synchrotron white beam topographs), and double or multiple-crystal topography (plane-wave, synchrotron topography, high-resolution). The formation of the images of the different types of individual defects and their contrast are discussed for the different experimental settings: dislocations, stacking faults, planar defects, and twins. It is shown how long range strains and lattice parameter variations can be mapped. Equal-strain and equal lattice parameter contours are described. Many examples of the use of topography for the characterization of materials are given.

Keywords:   topography, X-ray topographs, synchrotron topography, dislocations, stacking faults, twins, long range strains, characterization

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