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Introduction to Scanning Tunneling Microscopy – Second Edition - Oxford Scholarship Online
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Introduction to Scanning Tunneling Microscopy: Second Edition

C. Julian Chen


The scanning tunneling microscope (STM) and the atomic force microscope (AFM), both capable of visualizing and manipulating individual atoms, are the cornerstones of nanoscience and nanotechnology today. The inventors of STM, Gerd Binnig and Heinrich Rohrer, were awarded with the Nobel Prize of physics in 1986. Both microscopes are based on mechanically scanning an atomically sharp tip over a sample surface, with quantum-mechanical tunneling or atomic forces between the tip and the atoms on the sample as the measurable quantities. This book presents the principles of STM and AFM, and the exper ... More

Keywords: nanoscience, nanotechnology, scanning tunneling microscope, atomic force microscope, atom manipulation, tunneling, atomic forces, covalent bond, quantum-mechanical resonance

Bibliographic Information

Print publication date: 2007 Print ISBN-13: 9780199211500
Published to Oxford Scholarship Online: September 2007 DOI:10.1093/acprof:oso/9780199211500.001.0001


Affiliations are at time of print publication.

C. Julian Chen, author
Department of Applied Physics and Applied Mathematics, Columbia University, New York