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Introduction to Scanning Tunneling MicroscopySecond Edition$
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C. Julian Chen

Print publication date: 2007

Print ISBN-13: 9780199211500

Published to Oxford Scholarship Online: September 2007

DOI: 10.1093/acprof:oso/9780199211500.001.0001

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Scanning Tunneling Spectroscopy

Scanning Tunneling Spectroscopy

(p.331) Chapter 14 Scanning Tunneling Spectroscopy
Introduction to Scanning Tunneling Microscopy

C. Julian Chen

Oxford University Press

This chapter discusses various aspects of scanning tunneling spectroscopy (STS). It is an extension of the classical tunneling spectroscopy experiment to nanometer-scale or atomic-scale features on the sample surface. First, the electronics for STS is presented. The nature of STS as a convolution of tip DOS and sample DOS is discussed. Special tip treatment for the STS experiment, often different from the atomic-resolution STM, is described. The purpose is to produce tips with flat DOS, instead of special tip orbitals. A useful data process method, the Feenstra parameter, is presented. Experimental methods to determine tip DOS is discussed. A detailed account of the inelastic scanning tunneling spectroscopy, or STM-IETS, is then discussed. It includes the principles, the electronics, and the instrumental broadening of the features. This chapter concludes with the observation of the isotope effect in STM-IETS, a definitive signature of the vibrational spectra of molecules.

Keywords:   STS, tip treatment, Feenstra parameter, inelastic scanning tunneling spectroscopy, STM-IETS, instrumental broadening, isotope effect

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