Reflection acoustic microscopy of solid surfaces is generally dominated by interference between a specularly reflected wave and reflected waves associated with excitation of Rayleigh waves in the surface of the sample. The variation of signal as the sample is moved towards the lens is designated V(z). Samples which support Rayleigh waves exhibit oscillations in V(z) associated with this interference. The oscillations can be accounted for either in terms of wave theory, with the waves decomposed into their angular spectrum, or in terms of a ray model, with a geometrical and a Rayleigh contribution.
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