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Atomic Force Microscopy - Oxford Scholarship Online
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Atomic Force Microscopy

Peter Eaton and Paul West


Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (it allows the imaging of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it also allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and easy to use. Peter Eaton and Paul West share a common passion for atomic force microscopy. However, th ... More

Keywords: microscopes, AFM, scanning probe microscopy, instrumental techniques, imaging, SPM

Bibliographic Information

Print publication date: 2010 Print ISBN-13: 9780199570454
Published to Oxford Scholarship Online: May 2010 DOI:10.1093/acprof:oso/9780199570454.001.0001


Affiliations are at time of print publication.

Peter Eaton, author
Chemistry Department, University of Porto, Portugal

Paul West, author
Pacific NanoTechnology, California