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Principles of Materials Characterization and Metrology - Oxford Scholarship Online
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Principles of Materials Characterization and Metrology

Kannan M. Krishnan

Abstract

Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behavior (Engineering). With this focus, the book presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam- ... More

Keywords: Materials characterization & analysis, Metrology, Instrumentation, Diffraction, imaging, and spectroscopy methods, Electrons, photons, ions, neutrons, and scanning probes, Structure-property-processing relations, Surface science, Microscopic understanding of materials properties, Symmetry and crystallography, Applications in science, technology, and biology

Bibliographic Information

Print publication date: 2021 Print ISBN-13: 9780198830252
Published to Oxford Scholarship Online: July 2021 DOI:10.1093/oso/9780198830252.001.0001

Authors

Affiliations are at time of print publication.

Kannan M. Krishnan, author
Professor, Dept of Materials Science & Engineering, Adjunct Professor, Dept of Physics, University of Washington