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Principles of Materials Characterization and Metrology$
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Kannan M. Krishnan

Print publication date: 2021

Print ISBN-13: 9780198830252

Published to Oxford Scholarship Online: July 2021

DOI: 10.1093/oso/9780198830252.001.0001

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PRINTED FROM OXFORD SCHOLARSHIP ONLINE (oxford.universitypressscholarship.com). (c) Copyright Oxford University Press, 2021. All Rights Reserved. An individual user may print out a PDF of a single chapter of a monograph in OSO for personal use. date: 19 January 2022

Summary Tables

Summary Tables

Chapter:
(p.803) 12 Summary Tables
Source:
Principles of Materials Characterization and Metrology
Author(s):

Kannan M. Krishnan

Publisher:
Oxford University Press
DOI:10.1093/oso/9780198830252.003.0012

The three tables that follow provide an easily accessible comparative summary of the key points and features of the major characterization methods discussed in the text. The techniques are classified into three broad groups/methods: spectroscopy/chemical, diffraction/scattering, and imaging. For each technique, a concise description of the method and its use is followed, in bullet form, by its salient details and other characteristics, such as resolution, sensitivity etc., as well as specimen requirements that determine its practice. A general estimate of cost and space requirements is also included, but needless to say, this is only a snapshot for comparison and is definitely subject to change with time.

Keywords:   Comparison of characterization methods, Spectroscopy, Diffraction & scattering, Imaging & microscopy

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