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Introduction to Scanning Tunneling Microscopy - Oxford Scholarship Online
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Introduction to Scanning Tunneling Microscopy

C. Julian Chen

Abstract

The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it enables non-destructive observing and mapping atoms and molecules on solid surfaces down to a picometer resolution. A recent development is the non-destructive observation of wavefunctions in individual atoms and molecules, including nodal structures inside the wavefunctions. STM and AFM have become indespensible instruments for scientists of various disciplines, including physicists, chemists, engineers, and biologists to ... More

Keywords: Nanotechnology, nanoscience, scanning tunnelling microscope, atomic force microscope, quantum mechanics, atoms, molecules, wavefunctions, surface physics, spectroscopy, chemical bonds, tunnelling

Bibliographic Information

Print publication date: 2021 Print ISBN-13: 9780198856559
Published to Oxford Scholarship Online: April 2021 DOI:10.1093/oso/9780198856559.001.0001

Authors

Affiliations are at time of print publication.

C. Julian Chen, author
Adjunct Senior Research Scientist and Adjunct Professor, Department of Applied Physics and Applied Mathematics, Columbia University