- Title Pages
- Dedication
- List of Figures
- List of Tables
- Preface to the Third Edition
- Preface to the Second Edition
- Preface to the First Edition
- Gallery
-
Chapter 1 Overview -
Part I Principles -
Chapter 2 Tunneling Phenomenon -
Chapter 3 Tunneling Matrix Elements -
Chapter 4 Atomic Forces -
Chapte 5 Atomic Forces and Tunneling -
Chapter 6 Nanometer-Scale Imaging -
Chapter 7 Atomic-Scale Imaging -
Chapter 8 Imaging Wavefunctions -
Chapter 9 Nanomechanical Effects -
Part II Instrumentation -
Chapter 10 Piezoelectric Scanner -
Chapter 11 Vibration Isolation -
Chapter 12 Electronics and Control -
Chapter 13 Mechanical Design -
Chapter 14 Tip Treatment -
Part III Related Methods -
Chapter 15 Scanning Tunneling Spectroscopy -
Chapter 16 Atomic Force Microscopy -
Appendix A Green’s Functions -
Appendix B Real Spherical Harmonics -
Appendix C Spherical Modified Bessel Functions -
Appendix D Plane Groups and Invariant Functions -
Appendix E Elementary Elasticity Theory - Bibliography
- Index
Overview
Overview
- Chapter:
- (p.1) Chapter 1 Overview
- Source:
- Introduction to Scanning Tunneling Microscopy
- Author(s):
C. Julian Chen
- Publisher:
- Oxford University Press
This chapter presents the basic designs and working principles of STM and AFM, as well as an elementary theory of tunneling and the imaging mechanism of atomic resolution. Three elementary theories of tunneling are presented: the one-dimensional Schrödinger’s equation in vacuum, the semi-classical approximation, and the Landauer formalism. The relation between the decay constant and the work function, and a general expression of tunneling conductance versus tip-sample distance are derived. A brief summary of experimental facts on the mechanism of atomic resolution STM and AFM is presented, which leads to a picture of interplay between the atomic states of the tip and the sample, as well as the role of partial covalent bonds formed between those electronic states. Four illustrative applications are presented, including imaging self-assembed molecules on solid-liquid interfaces, electrochemical STM, catalysis research, and atom manipulation.
Keywords: scanning tunneling microscope, atomic force microscope, atom manipulation, tunneling, semi-classical approximation, work function, decay constant, atomic forces, Landauer formalism
Oxford Scholarship Online requires a subscription or purchase to access the full text of books within the service. Public users can however freely search the site and view the abstracts and keywords for each book and chapter.
Please, subscribe or login to access full text content.
If you think you should have access to this title, please contact your librarian.
To troubleshoot, please check our FAQs , and if you can't find the answer there, please contact us .
- Title Pages
- Dedication
- List of Figures
- List of Tables
- Preface to the Third Edition
- Preface to the Second Edition
- Preface to the First Edition
- Gallery
-
Chapter 1 Overview -
Part I Principles -
Chapter 2 Tunneling Phenomenon -
Chapter 3 Tunneling Matrix Elements -
Chapter 4 Atomic Forces -
Chapte 5 Atomic Forces and Tunneling -
Chapter 6 Nanometer-Scale Imaging -
Chapter 7 Atomic-Scale Imaging -
Chapter 8 Imaging Wavefunctions -
Chapter 9 Nanomechanical Effects -
Part II Instrumentation -
Chapter 10 Piezoelectric Scanner -
Chapter 11 Vibration Isolation -
Chapter 12 Electronics and Control -
Chapter 13 Mechanical Design -
Chapter 14 Tip Treatment -
Part III Related Methods -
Chapter 15 Scanning Tunneling Spectroscopy -
Chapter 16 Atomic Force Microscopy -
Appendix A Green’s Functions -
Appendix B Real Spherical Harmonics -
Appendix C Spherical Modified Bessel Functions -
Appendix D Plane Groups and Invariant Functions -
Appendix E Elementary Elasticity Theory - Bibliography
- Index
